BSI

Multi-part Document
BS EN 61967 - Integrated circuits. Measurement of electromagnetic emissions

https://doi.org/10.3403/BSEN61967

This is a multi-part document divided into the following parts:

  • Part 1 Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz. General conditions and definitions
  • Part 2 Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz. Measurement of radiated emissions. TEM cell and wideband TEM cell method
  • Part 4 Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz. Measurement of conducted emissions. 1 ohm/150 ohm direct coupling method
  • Part 5 Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz. Measurement of conducted emissions. Workbench Faraday Cage method
  • Part 6 Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz. Measurement of conducted emissions. Magnetic probe method
  • Part 8 Integrated circuits. Measurement of electromagnetic emissions. Measurement of radiated emissions. IC stripline method

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